What Is Atomic Force Microscopy? Observing Atoms in Action

Discover how Atomic Force Microscopy (AFM) allows scientists to observe and manipulate individual atoms with precision.

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The technique used to observe atoms is called Atomic Force Microscopy (AFM). This powerful method allows scientists to see and manipulate individual atoms by using a sharp tip that scans the surface, providing high-resolution images and enabling the study of atomic-scale properties.

FAQs & Answers

  1. What is Atomic Force Microscopy (AFM)? Atomic Force Microscopy (AFM) is a microscopy technique that provides high-resolution images of surfaces at the atomic level by scanning a sharp tip across the surface.
  2. How does AFM work? AFM works by using a cantilever with a sharp tip that interacts with the surface of a sample. As the tip moves closer to the surface, forces between the tip and the atoms cause the cantilever to deflect, allowing for detailed surface mapping.
  3. What are the applications of Atomic Force Microscopy? AFM is used in various fields, including materials science, biology, and nanotechnology, to study surface topography, mechanical properties, and molecular interactions.
  4. Is AFM limited to conducting materials? No, Atomic Force Microscopy can be used on both conducting and non-conducting materials, making it versatile for a wide range of applications in different scientific disciplines.